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Standard Testing
> Bad Connection
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Standard Testing - Bad Connection |
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Bad connections caused
by... |
Could be detected in tests
as... |
|
Open |
Intermittent
Open |
High Resistance |
| Wire not connected
or missing: |
X |
|
|
| Flux on mating
surface of contact |
X |
X |
X |
| Cold solder joint |
X |
X |
X |
| Wire insulation
caught in a crimp termination |
X |
X |
X |
| Metal oxides on
surface of joined metal parts including failure of gas tight
connection |
X |
X |
X |
|
Deformed/damaged/worn contact: including fatigue in spring force
of contact |
X |
X |
X |
| Failure of contact
to fully mate because contact is not retained in connector
housing |
X |
X |
X |
| Wrong wire gauge for
termination |
X |
X |
X |
| Loose crimps:
including those caused by missing strands of wire |
X |
X |
X |
| All strands broken:
(sometimes the result of excessive crimp force) |
X |
X |
X |
| Fixturing to the
device under test has any of the problems above |
X |
X |
X |
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